Exponential Stability for Markovian Jumping Stochastic BAM Neural Networks with Mode-Dependent Probabilistic Time-Varying Delays and Impulse Control

Title
Exponential Stability for Markovian Jumping Stochastic BAM Neural Networks with Mode-Dependent Probabilistic Time-Varying Delays and Impulse Control
Author(s)
박주현R. Rakkiyappan[R. Rakkiyappan]A. Chandrasekar[A. Chandrasekar]S. Lakshmanan[S. Lakshmanan]
Keywords
BIDIRECTIONAL ASSOCIATIVE MEMORY; GLOBAL ASYMPTOTIC STABILITY; NEUTRAL-TYPE; TRANSMISSION DELAYS; ROBUST STABILITY; MIXED DELAYS; PARAMETERS; CRITERIA
Issue Date
201501
Publisher
WILEY-BLACKWELL
Citation
COMPLEXITY, v.20, no.3, pp.39 - 65
Abstract
In this article, an exponential stability analysis of Markovian jumping stochastic bidirectional associative memory (BAM) neural networks with mode-dependent probabilistic time-varying delays and impulsive control is investigated. By establishment of a stochastic variable with Bernoulli distribution, the information of probabilistic time-varying delay is considered and transformed into one with deterministic time-varying delay and stochastic parameters. By fully taking the inherent characteristic of such kind of stochastic BAM neural networks into account, a novel Lyapunov-Krasovskii functional is constructed with as many as possible positive definite matrices which depends on the system mode and a triple-integral term is introduced for deriving the delay-dependent stability conditions. Furthermore, mode-dependent mean square exponential stability criteria are derived by constructing a new Lyapunov-Krasovskii functional with modes in the integral terms and using some stochastic analysis techniques. The criteria are formulated in terms of a set of linear matrix inequalities, which can be checked efficiently by use of some standard numerical packages. Finally, numerical examples and its simulations are given to demonstrate the usefulness and effectiveness of the proposed results. (c) 2014 Wiley Periodicals, Inc. Complexity 20: 39-65, 2015
URI
http://hdl.handle.net/YU.REPOSITORY/33677http://dx.doi.org/10.1002/cplx.21503
ISSN
1076-2787
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공과대학 > 전기공학과 > Articles
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