Full metadata record

DC FieldValueLanguage
dc.contributor.author이승우ko
dc.contributor.author배준ko
dc.contributor.author이승훈[이승훈]ko
dc.contributor.author장재원[장재원]ko
dc.date.accessioned2015-12-17T04:06:43Z-
dc.date.available2015-12-17T04:06:43Z-
dc.date.created2015-11-13-
dc.date.issued201408-
dc.identifier.citationBULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.35, no.8, pp.2415 - 2418-
dc.identifier.issn0253-2964-
dc.identifier.urihttp://hdl.handle.net/YU.REPOSITORY/31305-
dc.identifier.urihttp://dx.doi.org/10.5012/bkcs.2014.35.8.2415-
dc.description.abstractIn this report, the contact resistance between "electrode" and "lead" is investigated for reasonable measurements of samples' resistance in a polypyrrole (PPy) nanowire device. The sample's resistance, including "electrode-lead" contact resistance, shows a decrease as force applied to the interface increases. Moreover, the sample's resistance becomes reasonably similar to, or lower than, values calculated by resistivity of PPy reported in previous studies. The decrease of electrode-lead contact resistance by increasing the applying force was analyzed by using Holm theory: the general equation of relation between contact resistance (R-H) of two-metal thin films and contact force (R-H proportional to 1/root F). The present investigation can guide a reliable way to minimize electrode-lead contact resistance for reasonable characterization of nanomaterials in a microelectrode device; 80% of the maximum applying force to the junction without deformation of the apparatus shows reasonable values without experimental error.-
dc.language영어-
dc.publisherKOREAN CHEMICAL SOC-
dc.subjectCONSTRICTION RESISTANCE-
dc.subjectNANOWIRES-
dc.subjectFILMS-
dc.titleNormalized Contact Force to Minimize "Electrode-Lead" Resistance in a Nanodevice-
dc.typeArticle-
dc.identifier.wosid000340690600033-
dc.identifier.scopusid2-s2.0-84906330515-
Appears in Collections:
공과대학 > 화학공학부 > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE