Effects of Post-Annealing on Structural and Optical Properties of a-Axis Oriented ZnO Nanorods

Title
Effects of Post-Annealing on Structural and Optical Properties of a-Axis Oriented ZnO Nanorods
Author(s)
임재영[임재영]김민수[김민수]정재학이상헌윤현식[윤현식]
Keywords
THIN-FILMS; TEMPERATURE; DEPOSITION; SUBSTRATE; GROWTH; BUFFER; LAYERS
Issue Date
201309
Publisher
AMER SCIENTIFIC PUBLISHERS
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.9, pp.6236 - 6239
Abstract
Zinc oxide (ZnO) nanorods with a-axis orientation were grown on a Si(100) substrate by a hydrothermal method, following which a post-annealing process was carried out at various temperatures ranging from 500 to 900 degrees C in vacuum. Atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD), and photoluminescence (PL) were carried out to investigate the structural and optical properties of the a-axis oriented ZnO nanorods. The XRD pattern of the a-axis oriented ZnO nanorods shows three diffraction peaks at 31.84 degrees, 34.48 degrees, and 66.43 degrees, corresponding to ZnO (100), ZnO (002), and ZnO (200), respectively. The texture coefficient (TC) ratio of the a-axis to the c-axis is increased with the annealing temperature. The residual tensile stress of the a-axis oriented ZnO nanorods is increased and the bond length is slightly decreased with increasing the annealing temperature. The near-band-edge emission (NBE) peak of the a-axis oriented ZnO nanorods is blue-shifted by the annealing process.
URI
http://hdl.handle.net/YU.REPOSITORY/29024http://dx.doi.org/10.1166/jnn.2013.7688
ISSN
1533-4880
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공과대학 > 화학공학부 > Articles
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