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dc.contributor.author이병준ko
dc.contributor.authorSosan Cheon[Sosan Cheon]ko
dc.contributor.authorKenneth David Kihm[Kenneth David Kihm]ko
dc.contributor.authorJae Sung Park[Jae Sung Park]ko
dc.contributor.authorJoon Sik Lee[Joon Sik Lee]ko
dc.contributor.authorHyeoungkeun Kim[Hyeoungkeun Kim]ko
dc.contributor.authorByung Hee Hong[Byung Hee Hong]ko
dc.date.accessioned2015-12-17T02:12:24Z-
dc.date.available2015-12-17T02:12:24Z-
dc.date.created2015-11-13-
dc.date.issued201209-
dc.identifier.citationOPTICS LETTERS, v.37, no.18, pp.3765 - 3767-
dc.identifier.issn0146-9592-
dc.identifier.urihttp://hdl.handle.net/YU.REPOSITORY/27297-
dc.description.abstractThe total thickness of a graphene sample depends upon the number of individually stacked graphene layers. The corresponding surface plasmon resonance (SPR) reflectance alters the SPR angle, depending on the number of graphene layers. Thus, the correlation between the SPR angle shift and the number of graphene layers allows for a nonintrusive, real-time, and reliable counting of graphene layers. A single-layer graphene (SLG) is synthesized by means of chemical vapor deposition, followed by physical transfer to a thin gold film (48 nm) repeatedly, so that multilayer graphene samples with one, three, and five layers can be prepared. Both the measured SPR angles and the entire reflectance curve profiles successfully distinguish the number of graphene layers. (C) 2012 Optical Society of America-
dc.language영어-
dc.publisherOPTICAL SOC AMER-
dc.subjectPLASMON RESONANCE REFLECTANCE-
dc.subjectREFRACTIVE-INDEX-
dc.subjectFIELD-
dc.subjectSPECTROSCOPY-
dc.subjectCONSTANTS-
dc.subjectMETALS-
dc.subjectFILMS-
dc.titleHow to optically count graphene layers-
dc.typeArticle-
dc.identifier.wosid000309046300009-
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공과대학 > 기계공학부 > Articles
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