How to optically count graphene layers

Title
How to optically count graphene layers
Author(s)
이병준Sosan Cheon[Sosan Cheon]Kenneth David Kihm[Kenneth David Kihm]Jae Sung Park[Jae Sung Park]Joon Sik Lee[Joon Sik Lee]Hyeoungkeun Kim[Hyeoungkeun Kim]Byung Hee Hong[Byung Hee Hong]
Keywords
PLASMON RESONANCE REFLECTANCE; REFRACTIVE-INDEX; FIELD; SPECTROSCOPY; CONSTANTS; METALS; FILMS
Issue Date
201209
Publisher
OPTICAL SOC AMER
Citation
OPTICS LETTERS, v.37, no.18, pp.3765 - 3767
Abstract
The total thickness of a graphene sample depends upon the number of individually stacked graphene layers. The corresponding surface plasmon resonance (SPR) reflectance alters the SPR angle, depending on the number of graphene layers. Thus, the correlation between the SPR angle shift and the number of graphene layers allows for a nonintrusive, real-time, and reliable counting of graphene layers. A single-layer graphene (SLG) is synthesized by means of chemical vapor deposition, followed by physical transfer to a thin gold film (48 nm) repeatedly, so that multilayer graphene samples with one, three, and five layers can be prepared. Both the measured SPR angles and the entire reflectance curve profiles successfully distinguish the number of graphene layers. (C) 2012 Optical Society of America
URI
http://hdl.handle.net/YU.REPOSITORY/27297
ISSN
0146-9592
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공과대학 > 기계공학부 > Articles
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