Transmission Electron Microscope Study of Screen-Printed Ag Contacts on Crystalline Si Solar Cells

Title
Transmission Electron Microscope Study of Screen-Printed Ag Contacts on Crystalline Si Solar Cells
Author(s)
정명일[정명일]박성은[박성은]김동환[김동환]이준성[이준성]박윤찬[박윤찬]안광순최철종[최철종]
Keywords
THICK-FILM CONTACTS; EMITTERS; INTERFACE; GROWTH
Issue Date
201010
Publisher
ELECTROCHEMICAL SOC INC
Citation
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.157, no.10, pp.H934 - H936
Abstract
Microstructural and chemical properties of screen-printed Ag contacts on an n(+) emitter surface in crystalline Si solar cells are investigated using a transmission electron microscope. The Pb-based glass layer, where many Ag precipitates are randomly distributed, is formed between a Ag thick film and textured Si. For both textured and nontextured Si surfaces, the Ag crystallites are epitaxially grown on Si with an abrupt interface along the {111} atomic plane. Based on high resolution electron microscopy images combined with fast Fourier transform patterns, the registry of Ag on Si driven by a geometrical matching condition leads to minimization of the effective lattice mismatch between Ag and Si, resulting in the formation of a Ag/Si epitaxial superlattice near the interface region. (C) 2010 The Electrochemical Society. [DOI: 10.1149/1.3473812] All rights reserved.
URI
http://hdl.handle.net/YU.REPOSITORY/23504http://dx.doi.org/10.1149/1.3473812
ISSN
0013-4651
Appears in Collections:
공과대학 > 화학공학부 > Articles
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